Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation
Yuchen Xu, Andrew M. Thomas, Peter A. Crozier, David S. Matteson
TL;DR
This work tackles the challenge of tracking atomic columns in high-noise TEM videos by proposing a non-parametric, spatio-temporal ridge estimation framework that leverages temporal correlations to recover continuous trajectories. The method combines intra-frame ridge indicators with an inter-frame continuity penalty to score and assemble candidate ridge points across frames, followed by a kernel-based non-parametric curve connection to yield a smooth trajectory over time, along with uncertainty quantification. Through simulations and synthetic TEM experiments, the approach demonstrates improved accuracy and robustness relative to framewise benchmarks, including scenarios with disappearing and reappearing columns. The framework offers practical value for in situ materials analysis by enabling reliable, continuous tracking of atomic-scale features under challenging imaging conditions.
Abstract
Ridge detection is a classical tool to extract curvilinear features in image processing. As such, it has great promise in applications to material science problems; specifically, for trend filtering relatively stable atom-shaped objects in image sequences, such as Transmission Electron Microscopy (TEM) videos. Standard analysis of TEM videos is limited to frame-by-frame object recognition. We instead harness temporal correlation across frames through simultaneous analysis of long image sequences, specified as a spatio-temporal image tensor. We define new ridge detection algorithms to non-parametrically estimate explicit trajectories of atomic-level object locations as a continuous function of time. Our approach is specially tailored to handle temporal analysis of objects that seemingly stochastically disappear and subsequently reappear throughout a sequence. We demonstrate that the proposed method is highly effective and efficient in simulation scenarios, and delivers notable performance improvements in TEM experiments compared to other material science benchmarks.
