On metrics robust to noise and deformations
William Leeb
TL;DR
This work introduces Volterra $p$-norms, $\|f\|_{V^p}$, and the induced Volterra $p$-distances as a robust class of integral probability metrics for univariate functions and their tomographic projections. Through a variational characterization and a suite of robustness results, the authors show that these distances are resistant to a broad class of deformations and additive Gaussian noise, with stronger bounds in certain monotone or rotated-projection settings. The paper extends these ideas to sliced Volterra distances for multivariate functions, provides a trapezoidal-rule-based discrete framework with provable convergence rates ($O(1/n)$ for Lipschitz and $O(1/n^2)$ for smooth) and noise robustness, and demonstrates numerical behavior that parallels, and in some regimes outperforms, Wasserstein-based metrics. The results offer practical tools for robust comparison of signals and projections in applications such as tomography and cryo-EM, where data are often noisy and deformations are common.
Abstract
We study the properties of a family of distances between functions of a single variable. These distances are examples of integral probability metrics, and have been used previously for comparing probability measures on the line; special cases include the Earth Mover's Distance and the Kolmogorov Metric. We examine their properties for general signals, proving that they are robust to a broad class of deformations. We also establish corresponding robustness results for the induced sliced distances between multivariate functions. Finally, we establish error bounds for approximating the univariate metrics from finite samples, and prove that these approximations are robust to additive Gaussian noise. The results are illustrated in numerical experiments, which include comparisons with Wasserstein distances.
