Tight Localizations of Feedback Sets
Michael Hecht, Krzysztof Gonciarz, Szabolcs Horvát
TL;DR
This work addresses the directed feedback arc set problem (FASP) and its dual, the feedback vertex set problem (FVSP), by introducing a practical $O(|V||E|^4)$-time heuristic, TIGHT-CUT, designed for large, sparse graphs typical in circuit design. Central to the approach are the building block ISO-CUT, which leverages isolated cycles to localize optimal arc cuts, and GOOD-GUESS, which selects promising cuts via minimum $s$-$t$-cuts; together they form the global algorithm TIGHT-CUT and its relaxed variant TIGHT-CUT*. Empirical evaluation across synthetic and real-world circuit graphs shows TIGHT-CUT* frequently achieves approximation ratios under 1.6 and substantially outperforms the Greedy Removal heuristic, while solving large instances that ILP-based methods struggle with. The results indicate meaningful practical gains for circuit testing and other applications requiring acyclic subgraph extraction, with potential for further speedups through parallelization and optimized min-cut implementations.
Abstract
The classical NP-hard feedback arc set problem (FASP) and feedback vertex set problem (FVSP) ask for a minimum set of arcs $\varepsilon \subseteq E$ or vertices $ν\subseteq V$ whose removal $G\setminus \varepsilon$, $G\setminus ν$ makes a given multi-digraph $G=(V,E)$ acyclic, respectively. Though both problems are known to be APX-hard, approximation algorithms or proofs of inapproximability are unknown. We propose a new $\mathcal{O}(|V||E|^4)$-heuristic for the directed FASP. While a ratio of $r \approx 1.3606$ is known to be a lower bound for the APX-hardness, at least by empirical validation we achieve an approximation of $r \leq 2$. The most relevant applications, such as circuit testing, ask for solving the FASP on large sparse graphs, which can be done efficiently within tight error bounds due to our approach.
