Critical points and number of master integrals
Roman N. Lee, Andrei A. Pomeransky
TL;DR
The paper tackles counting master integrals in multiloop Feynman diagrams by linking the MI count to the critical points of Symanzik-related polynomials. It proposes a geometric approach where the number of MIs equals the sum of Milnor numbers of proper critical points of the combined polynomial G=F+U in the parametric representation (or P0 in Baikov), with Lefschetz thimbles providing a basis of integration contours. The authors develop an algorithm and a Mathematica package, Mint, to automate MI counting and demonstrate its effectiveness on a large 4-loop on-shell g-2 family, including handling rare non-isolated critical point cases. This framework offers a rigorous, geometry-based alternative to brute-force IBP reductions and suggests potential broader applications in algebraic geometry and integral reductions.
Abstract
We consider the question about the number of master integrals for a multiloop Feynman diagram. We show that, for a given set of denominators, this number is totally determined by the critical points of the polynomials entering either of the two representations: the parametric representation and the Baikov representation. In particular, for the parametric representation the corresponding polynomial is just the sum of Symanzik polynomials. The relevant topological invariant is the sum of the Milnor numbers of the proper critical points. We present a Mathematica package Mint to automatize the counting of the master integrals.
