Classification and analysis of two dimensional abelian fractional topological insulators
Michael Levin, Ady Stern
TL;DR
This work develops a bulk Chern-Simons framework for time-reversal invariant 2D abelian insulators, characterized by $(\mathcal{K}, \boldsymbol{\tau}, T, \boldsymbol{\chi})$, and derives a sharp edge-stability criterion: edge modes are protected if and only if $\frac{1}{e^*}\, \boldsymbol{\chi}^T \mathcal{K}^{-1} \boldsymbol{\tau}$ is odd, where $e^*$ is the smallest charge. It introduces local Kramers degeneracy and a local Kramers theorem, and proves the edge protection via microscopic edge analysis and a generalized flux-insertion argument that preserves the topological sector. The results unify prior fractional topological insulator constructions, provide a general classification, and suggest extensions to bosonic systems and higher dimensions. The framework paves the way for systematic exploration of interacting, TR-invariant topological phases with abelian statistics and their protected edge phenomena.
Abstract
We present a general framework for analyzing fractionalized, time reversal invariant electronic insulators in two dimensions. The framework applies to all insulators whose quasiparticles have abelian braiding statistics. First, we construct the most general Chern-Simons theories that can describe these states. We then derive a criterion for when these systems have protected gapless edge modes -- that is, edge modes that cannot be gapped out without breaking time reversal or charge conservation symmetry. The systems with protected edge modes can be regarded as fractionalized analogues of topological insulators. We show that previous examples of 2D fractional topological insulators are special cases of this general construction. As part of our derivation, we define the concept of "local Kramers degeneracy" and prove a local version of Kramers theorem.
