Direct Detection of Sub-GeV Dark Matter
Rouven Essig, Jeremy Mardon, Tomer Volansky
TL;DR
The paper addresses the challenge of directly detecting sub-GeV dark matter by exploiting DM–electron scattering to produce observable electron ionization, since nuclear recoils are typically too small to detect in this mass range. It develops a model-independent framework using a reference cross section $\overline{\sigma}_e$ and a DM form factor $F_{\rm DM}(q)$, derives ionization rates for atomic/molecular targets and crystals, and evaluates experimental sensitivities with realistic backgrounds. Key contributions include explicit rate formulas, treatment of atomic and crystal ionization form factors, and qualitative/quantitative sensitivity estimates across xenon, argon, helium, and germanium targets, including neutrino backgrounds and annual modulation as a signal discriminator. The results indicate that existing and near-future direct-detection experiments could probe new regions of light DM parameter space, potentially discovering or constraining hidden-sector scenarios such as kinetic-mmixing mediated interactions and Freeze-In production mechanisms, with dedicated detectors offering significant gains.
Abstract
Direct detection strategies are proposed for dark matter particles with MeV to GeV mass. In this largely unexplored mass range, dark matter scattering with electrons can cause single-electron ionization signals, which are detectable with current technology. Ultraviolet photons, individual ions, and heat are interesting alternative signals. Focusing on ionization, we calculate the expected dark matter scattering rates and estimate the sensitivity of possible experiments. Backgrounds that may be relevant are discussed. Theoretically interesting models can be probed with existing technologies, and may even be within reach using ongoing direct detection experiments. Significant improvements in sensitivity should be possible with dedicated experiments, opening up a window to new regions in dark matter parameter space.
